Electronic microscopy

Plateform :Centre de MicroCaractérisation Raimond Castaing (UMS 3623)
http://ccarcastaing.cnrs.fr/

Location :Centre housed in the “Espace Clément Ader” in the scientific complex « Toulouse Montaudran Aerospace ».
3 rue Caroline Aigle (ancienne piste de Montaudran dans le prolongement de l’avenue Didier Daurat)

LHFA Contact :Christian Pradel

The Castaing Centre comprises 12 instruments for micro- and nano-characterisation (2 electronic microprobes, 4 scanning electron microscopes, 5 transmission electron microscopes), and also appropriate equipment for preparation of samples.

Scanning electron microscopy (SEM) allows a morphological, structural and chemical analysis of compounds at micron or nanometer scale. The Castaing Centre holds the following SEM instruments :

  • MEB/FIB FEI HELIOS 600i - EDS
  • MEB-FEG JEOL JSM 7800F Prime - EDS
  • MEB FEG JEOL JSM 7100F TTLS LV - EDS/EBSD
  • MEB FEG JEOL JSM 6700F – EDS

MEB

 

Transmission electron microscopy (TEM) allows morphological, structural and chemical analysis of solid compounds at the atomic scale. The Castaing Centre holds the following TEM instruments :

  • MET JEOL JEM-ARM200F Cold FEG corrigé sonde - EDS/EELS
  • MET JEOL JSM 2100F - EDS
  • MET JEOL JEM 2010 - EDS
  • MET JEOL JEM 1400
  • MET JEOL JEM 1011

TEM

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